MET/CAL Procedure ============================================================================= INSTRUMENT: Fluke 6061A Sub1 DATE: 25-Jun-96 AUTHOR: D.C. Bansen REVISION: 1 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 65 NUMBER OF LINES: 255 CONFIGURATION: Philips PM 6680 (21) CONFIGURATION: HP 8902A ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R N P F W 1.002 ASK+ X 1.003 IEEE [SRQ OFF] 1.004 HEAD {* SYNTHESIS TEST *} 1.005 HEAD {} 1.006 JMP 2.001 1.007 EVAL Dummy 2.001 HEAD SYNTHESIS TEST 2.002 DISP Connect the UUT OUTPUT to input C of the PHILIPS 6680 2.002 DISP counter. 2.003 IEEE RC98 2.003 IEEE FR111.1111MZ 2.004 6680 111.1111MH 0.0001U 70.7mV +A FC 2W 3.001 IEEE FR222.2222MZ 3.002 6680 222.2222MH 0.0001U 70.7mV +A FC 2W 4.001 IEEE FR333.3333MZ 4.002 6680 333.3333MH 0.0001U 70.7mV +A FC 2W 5.001 IEEE FR444.4444MZ 5.002 6680 444.4444MH 0.0001U 70.7mV +A FC 2W 6.001 IEEE FR555.5555MZ 6.002 6680 555.5555MH 0.0001U 70.7mV +A FC 2W 7.001 IEEE FR666.6680MZ 7.002 6680 666.6680MH 0.0001U 70.7mV +A FC 2W 8.001 IEEE FR777.7777MZ 8.002 6680 777.7777MH 0.0001U 70.7mV +A FC 2W 9.001 IEEE FR888.8888MZ 9.002 6680 888.8888MH 0.0001U 70.7mV +A FC 2W 10.001 IEEE FR999.9999MZ 10.002 6680 999.9999MH 0.0001U 70.7mV +A FC 2W 11.001 MESS 11.002 HEAD 11.003 DISP Disconnect the test set-up. 11.004 CALL 11722A Power 11.005 HEAD {* HIGH-LEVEL ACCURACY TEST *} 11.006 HEAD {} 11.007 HEAD {Frequency @ 0.4MHz} 11.008 HEAD {} 11.009 JMP 12.001 11.010 EVAL Dummy 12.001 HEAD HIGH-LEVEL ACCURACY TEST 12.002 DISP Connect the Hewlett Packard 11722A Sensor Module to the 12.002 DISP UUT RF OUTPUT connector. 12.003 IEEE RC98 12.003 IEEE FR0.4MZ 12.003 IEEE AP+12DB 12.004 IEEE [@8902] [TERM LF] 12.004 IEEE [@8902] IP, FR 0.4MZ 12.004 IEEE [@8902] M4, LG 12.004 IEEE [@8902] [I] 12.005 MEMC 12.0D 1U 13.001 IEEE AP+6DB 13.002 IEEE [@8902] [I] 13.003 MEMC 6.0D 1U 14.001 IEEE AP0DB 14.002 IEEE [@8902] [I] 14.003 MEMC 0.0D 1U 15.001 IEEE AP-12DB 15.002 IEEE [@8902] [I] 15.003 MEMC -12.0D 1U 16.001 IEEE AP-12DB, SP83 16.002 IEEE [@8902] [I] 16.003 MEMC -12.0D 1U SPCL_83 17.001 IEEE AP-12DB, SP84 17.002 IEEE [@8902] [I] 17.003 MEMC -12.0D 1U SPCL_84 18.001 IEEE AP-12DB, SP85 18.002 IEEE [@8902] [I] 18.003 MEMC -12.0D 1U SPCL_85 19.001 IEEE AP-12DB, SP86 19.002 IEEE [@8902] [I] 19.003 MEMC -12.0D 1U SPCL_86 20.001 HEAD {} 20.002 HEAD {Frequency @ 120MHz} 20.003 HEAD {} 20.004 JMP 21.001 20.005 EVAL Dummy 21.001 HEAD HIGH-LEVEL ACCURACY TEST 21.002 IEEE RC98 21.002 IEEE FR120MZ 21.002 IEEE AP+12DB 21.003 IEEE [@8902] FR 120MZ 21.003 IEEE [@8902] M4, LG 21.003 IEEE [@8902] [I] 21.004 MEMC 12.0D 1U 22.001 IEEE AP+6DB 22.002 IEEE [@8902] [I] 22.003 MEMC 6.0D 1U 23.001 IEEE AP0DB 23.002 IEEE [@8902] [I] 23.003 MEMC 0.0D 1U 24.001 IEEE AP-12DB 24.002 IEEE [@8902] [I] 24.003 MEMC -12.0D 1U 25.001 IEEE AP-12DB, SP83 25.002 IEEE [@8902] [I] 25.003 MEMC -12.0D 1U SPCL_83 26.001 IEEE AP-12DB, SP84 26.002 IEEE [@8902] [I] 26.003 MEMC -12.0D 1U SPCL_84 27.001 IEEE AP-12DB, SP85 27.002 IEEE [@8902] [I] 27.003 MEMC -12.0D 1U SPCL_85 28.001 IEEE AP-12DB, SP86 28.002 IEEE [@8902] [I] 28.003 MEMC -12.0D 1U SPCL_86 29.001 HEAD {} 29.002 HEAD {Frequency @ 244MHz} 29.003 HEAD {} 29.004 JMP 30.001 29.005 EVAL Dummy 30.001 HEAD HIGH-LEVEL ACCURACY TEST 30.002 IEEE RC98 30.002 IEEE FR244MZ 30.002 IEEE AP+12DB 30.003 IEEE [@8902] FR 244MZ 30.003 IEEE [@8902] M4, LG 30.003 IEEE [@8902] [I] 30.004 MEMC 12.0D 1U 31.001 IEEE AP+6DB 31.002 IEEE [@8902] [I] 31.003 MEMC 6.0D 1U 32.001 IEEE AP0DB 32.002 IEEE [@8902] [I] 32.003 MEMC 0.0D 1U 33.001 IEEE AP-12DB 33.002 IEEE [@8902] [I] 33.003 MEMC -12.0D 1U 34.001 IEEE AP-12DB, SP83 34.002 IEEE [@8902] [I] 34.003 MEMC -12.0D 1U SPCL_83 35.001 IEEE AP-12DB, SP84 35.002 IEEE [@8902] [I] 35.003 MEMC -12.0D 1U SPCL_84 36.001 IEEE AP-12DB, SP85 36.002 IEEE [@8902] [I] 36.003 MEMC -12.0D 1U SPCL_85 37.001 IEEE AP-12DB, SP86 37.002 IEEE [@8902] [I] 37.003 MEMC -12.0D 1U SPCL_86 38.001 HEAD {} 38.002 HEAD {Frequency @ 245MHz} 38.003 HEAD {} 38.004 JMP 39.001 38.005 EVAL Dummy 39.001 HEAD HIGH-LEVEL ACCURACY TEST 39.002 IEEE RC98 39.002 IEEE FR245MZ 39.002 IEEE AP+12DB 39.003 IEEE [@8902] FR 245MZ 39.003 IEEE [@8902] M4, LG 39.003 IEEE [@8902] [I] 39.004 MEMC 12.0D 1U 40.001 IEEE AP+6DB 40.002 IEEE [@8902] [I] 40.003 MEMC 6.0D 1U 41.001 IEEE AP0DB 41.002 IEEE [@8902] [I] 41.003 MEMC 0.0D 1U 42.001 IEEE AP-12DB 42.002 IEEE [@8902] [I] 42.003 MEMC -12.0D 1U 43.001 IEEE AP-12DB, SP83 43.002 IEEE [@8902] [I] 43.003 MEMC -12.0D 1U SPCL_83 44.001 IEEE AP-12DB, SP84 44.002 IEEE [@8902] [I] 44.003 MEMC -12.0D 1U SPCL_84 45.001 IEEE AP-12DB, SP85 45.002 IEEE [@8902] [I] 45.003 MEMC -12.0D 1U SPCL_85 46.001 IEEE AP-12DB, SP86 46.002 IEEE [@8902] [I] 46.003 MEMC -12.0D 1U SPCL_86 47.001 HEAD {} 47.002 HEAD {Frequency @ 850MHz} 47.003 HEAD {} 47.004 JMP 48.001 47.005 EVAL Dummy 48.001 HEAD HIGH-LEVEL ACCURACY TEST 48.002 IEEE RC98 48.002 IEEE FR850MZ 48.002 IEEE AP+12DB 48.003 IEEE [@8902] FR 850MZ 48.003 IEEE [@8902] M4, LG 48.003 IEEE [@8902] [I] 48.004 MEMC 12.0D 1U 49.001 IEEE AP+6DB 49.002 IEEE [@8902] [I] 49.003 MEMC 6.0D 1U 50.001 IEEE AP0DB 50.002 IEEE [@8902] [I] 50.003 MEMC 0.0D 1U 51.001 IEEE AP-12DB 51.002 IEEE [@8902] [I] 51.003 MEMC -12.0D 1U 52.001 IEEE AP-12DB, SP83 52.002 IEEE [@8902] [I] 52.003 MEMC -12.0D 1U SPCL_83 53.001 IEEE AP-12DB, SP84 53.002 IEEE [@8902] [I] 53.003 MEMC -12.0D 1U SPCL_84 54.001 IEEE AP-12DB, SP85 54.002 IEEE [@8902] [I] 54.003 MEMC -12.0D 1U SPCL_85 55.001 IEEE AP-12DB, SP86 55.002 IEEE [@8902] [I] 55.003 MEMC -12.0D 1U SPCL_86 56.001 HEAD {} 56.002 HEAD {Frequency @ 1050MHz} 56.003 HEAD {} 56.004 JMP 57.001 56.005 EVAL Dummy 57.001 HEAD HIGH-LEVEL ACCURACY TEST 57.002 IEEE RC98 57.002 IEEE FR1050MZ 57.002 IEEE AP+12DB 57.003 IEEE [@8902] FR 1050MZ 57.003 IEEE [@8902] M4, LG 57.003 IEEE [@8902] [I] 57.004 MEMC 12.0D 1U 58.001 IEEE AP+6DB 58.002 IEEE [@8902] [I] 58.003 MEMC 6.0D 1U 59.001 IEEE AP0DB 59.002 IEEE [@8902] [I] 59.003 MEMC 0.0D 1U 60.001 IEEE AP-12DB 60.002 IEEE [@8902] [I] 60.003 MEMC -12.0D 1U 61.001 IEEE AP-12DB, SP83 61.002 IEEE [@8902] [I] 61.003 MEMC -12.0D 1U SPCL_83 62.001 IEEE AP-12DB, SP84 62.002 IEEE [@8902] [I] 62.003 MEMC -12.0D 1U SPCL_84 63.001 IEEE AP-12DB, SP85 63.002 IEEE [@8902] [I] 63.003 MEMC -12.0D 1U SPCL_85 64.001 IEEE AP-12DB, SP86 64.002 IEEE [@8902] [I] 64.003 MEMC -12.0D 1U SPCL_86 65.001 END